By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations when it comes to checking out and diagnostics. stories are really susceptible to defects in view that they make the most the expertise limits to get the top density. This e-book is a useful consultant to the checking out and diagnostics of the most recent new release of SRAM, essentially the most extensively utilized different types of reminiscence. Classical equipment for checking out reminiscence are designed to deal with the so-called "static faults," yet those attempt options aren't enough for faults which are rising within the most recent Very Deep Sub-Micron (VDSM) applied sciences. those new fault types, known as "dynamic faults", aren't lined through classical try suggestions and require the committed attempt sequences offered during this book.
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Extra info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel